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Volumn , Issue , 1999, Pages 95-98

Integrated millimeter-wave photonic probes for an on-wafer network analyzer

Author keywords

[No Author keywords available]

Indexed keywords

PROBES;

EID: 0006645257     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWP.1999.819660     Document Type: Conference Paper
Times cited : (2)

References (8)
  • 4
    • 0030192206 scopus 로고    scopus 로고
    • Optoelectronic techniques for ultrafast device network analysis to 700 GHz
    • M. Y. Frankel, Optoelectronic techniques for ultrafast device network analysis to 700 GHz, Opt. Quantum Electron., vo1.28, pp. 783-800, 1996.
    • (1996) Opt Quantum Electron , vol.28 , pp. 783-800
    • Frankel, M.Y.1
  • 7
    • 0033157555 scopus 로고    scopus 로고
    • Application of 1.55-pm photonic technology to practical millimeter-wave network analysis, to be published in IEICE Trans
    • Dec
    • N. Sahri and T. Nagatsuma, Application of 1.55-pm photonic technology to practical millimeter-wave network analysis, to be published in IEICE Trans. Electron. in Dec. 1999.
    • (1999) Electron
    • Sahri, N.1    Nagatsuma, T.2
  • 8
    • 0030121384 scopus 로고    scopus 로고
    • Electro-optic testing technology for high-speed LSIs
    • April
    • T. Nagatsuma, Electro-optic testing technology for high-speed LSIs, IEICE Trans. Electron., vol. E79-C, no. 4, pp. 482-488, April 1996.
    • (1996) IEICE Trans. Electron , vol.79 , Issue.4 , pp. 482-488
    • Nagatsuma, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.