Atomic force microscope for operation in high magnetic fields at millikelvin temperatures

Review of Scientific Instruments

Volumn 70, Issue 1 PART II, 1999, Pages 114-120

  Pelekhov, D V ^a,b   Becker, J B ^a   Nunes Jr , G ^a  

^a Dartmouth College ^*  (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006481664     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149551     Document Type: Review

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