Atomic force microscope for operation in high magnetic fields at millikelvin temperatures

Review of Scientific Instruments

Volumn 70, Issue 1 PART II, 1999, Pages 114-120

  Pelekhov, D V ^a,b   Becker, J B ^a   Nunes Jr , G ^a  

^a Lamont Doherty Earth Observatory   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006481664     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149551     Document Type: Review

References (42)

1. G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, Appl. Phys. Lett. 40, 178 (1982).
2. G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
3. C. B. Prater, M. R. Wilson, J. Gamaes, J. Massie, V. B. Elings, and P. K. Hansma, J. Vac. Sci. Technol. B 9, 989 (1991).
4. H. F. Hess, R. B. Robinson, J. M. Valles, and J. V. Waszcak, Phys. Rev. Lett. 62, 214 (1989).
5. D. M. Eigler and E. K. Schweizer, Nature (London) 344, 524 (1990).
6. See, for example, J. Vac. Sci. Technol. B 14, 787 (1995).
7. D. M. Eigler, C. P. Lutz, and W. E. Rudge, Nature (London) 352, 600 (1991).
8. C. P. Umbach, S. Washburn, R. B. Laibowitz, and R. A. Webb, Phys. Rev. B 30, 4048 (1984).
9. R. A. Webb, S. Washburn, C. P. Umbach, and R. B. Laibowitz, Phys. Rev. Lett. 54, 2696 (1985).
10. D. Loss, H. Schoeller, and P. M. Goldbart, Phys. Rev. B 48, 15218 (1993).
11. Y. Lyanda-Geller, Phys. Rev. Lett. 71, 657 (1993).
12. S. H. Tessmer, P. I. Glicofridis, R. C. Ashoori, L. S. Levitov, and M. R. Melloch, Nature (London) 392, 51 (1998).
13. S. Feng, P. A. Lee, and A. D. Stone, Phys. Rev. Lett. 56, 1960, 2772(E) (1986).
14. M. D. Kirk, T. R. Albrecht, and C. F. Quate, Rev. Sci. Instrum. 59, 833 (1988).
15. F. J. Giessibl, Ch. Gerber, and G. Binnig, J. Vac. Sci. Technol. B 9, 984 (1991).
16. T. R. Albrecht, P. Grütter, D. Rugar, and D. P. E. Smith, Ultramicroscopy 42-44, 1638 (1992).
17. A brief report on aspects of this instrument's performance has been given previously in D. V. Pelekhov, J. B. Becker, and G. Nunes, Jr., Appl. Phys. Lett. 72, 993 (1998).
18. G. Binnig and D. P. E. Smith, Rev. Sci. Instrum. 57, 1688 (1986).
19. Staveley Sensors, East Hartford, CT.
20. D. Rugar, H. J. Mamin, and P. Guethner, Appl. Phys. Lett. 55, 2588 (1989).
21. Coming Inc., Coming, NY.
22. Stycast 1266, Emerson & Cuming, Woburn, MA.
23. G. Nunes, Jr. and D. Williams, J. Vac. Sci. Technol. B 13, 1063 (1995).
24. C. W. Yuan, E. Batalla, M. Zacher, A. L. de Lozanne, M. D. Kirk, and M. Tortonese, Appl. Phys. Lett. 65, 1308 (1994).
25. R. G. Beck, M. A. Eriksson, R. M. Westervelt, K. L. Camperman, and A. C. Gossard, Appl. Phys. Lett. 68, 3763 (1996).
26. Torr Seal, Varian Vacuum Products, Lexington, MA.
27. Microlever with a sharpened tip, Park Scientific Instruments, Sunnyvale, CA.
28. IP28A, Hamamatsu, Bridgewater, NJ.
29. 22-30863-50-21201, Gould, Glen Burnie, MD.
30. Ch. Renner, Ph. Niedermann, A. D. Kent, and Ø. Fischer, Rev. Sci. Instrum. 61, 965 (1990).
31. Experimental Techniques in Condensed Matter Physics at Low Temperatures, edited by R. C. Richardson and E. N. Smith (Addison-Wesley, Redwood City, CA, 1988).
32. Technical Manufacturing Corp., Peabody, MA.
33. K. G. Vandervoort, R. K. Zasadzinski, G. G. Galicia, and G. W. Crabtree, Rev. Sci. Instrum. 64, 896 (1993).
34. J. M. Soler, A. M. Baro, N. Garcia, and H. Rohrer, Phys. Rev. Lett. 57, 444 (1986).
35. F. F. Abraham and I. P. Batra, Surf. Sci. 209, L125 (1989).
36. K. Yamanaka, Thin Solid Films 273, 116 (1996).
37. G. Binnig, Ch. Gerber, E. Stoll, T. R. Albrecht, and C. F. Quate, Europhys. Lett. 3, 1281 (1987).
38. O. Marti, B. Drake, and P. K. Hansma, Appl. Phys. Lett. 51, 484 (1987).
39. N. A. Bumham and R. J. Colton, J. Vac. Sci. Technol. A 7, 2906 (1989).
40. F. Pobell, Matter and Methods at Low Temperatures (Springer, Berlin, 1996).
41. C. A. J. Putman, K. O. Van der Werf, B. G. De Grooth, N. F. Van Hulst, and J. Greve, Appl. Phys. Lett. 64, 2454 (1994).
42. H. Muramatsu and N. Chiba, Appl. Phys. Lett. 71, 2061 (1997).