Microstructure of thermally grown and deposited alumina films probed with positrons

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 10, 1999, Pages 6675-6688

  Somieski, Bertram ^a   Hulett, Lester D ^a   Xu, Jun ^a   Pint, Bruce A ^a   Tortorelli, Peter F ^a   Nielsen, Bent ^b   Asoka Kumar, Palakkal ^b   Suzuki, Ryoichi ^c   Ohdaira, Toshiyuki ^c  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006156091     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.6675     Document Type: Article

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