Microdefects in Al2O3 films and interfaces revealed by positron lifetime spectroscopy

Applied Physics Letters

Volumn 71, Issue 21, 1997, Pages 3165-3167

  Xu, Jun ^a   Somieski, B ^a   Hulett, L D ^a   Pint, B A ^a   Tortorelli, P F ^a   Suzuki, R ^b   Ohdaira, T ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b ELECTROTECHNICAL LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344546725     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120278     Document Type: Article

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