FILL and FUNI: Algorithms to identify illegal states and sequentially untestable faults

ACM Transactions on Design Automation of Electronic Systems

Volumn 5, Issue 3, 2000, Pages 631-657

  Long, David E ^a,c   Iyer, Mahesh A ^b,d   Abramovici, Miron ^a,c  

^a NOKIA RESEARCH CENTER   (United States)

^b PurpleYogi Inc   (United States)

^c LUCENT TECHNOLOGIES   (United States)

^d SYNOPSYS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005575639     PISSN: 10844309     EISSN: None     Source Type: Journal    
DOI: 10.1145/348019.348311     Document Type: Article

References (35)

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