Photoelectron microspectroscopy observations of a cleaved surface of semiconductor double heterostructure

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 16, Issue 3, 1998, Pages 1086-1090

  Kiyokura, Takanori ^a   Maeda, Fumihiko ^a   Watanabe, Yoshio ^a   Kadota, Yoshiaki ^b   Iketaki, Yoshinori ^c   Horikawa, Yoshiaki ^c   Oshima, Masaharu ^d   Shigemasa, Eiji ^e   Yagishita, Akira ^e  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

^b NTT CORPORATION   (Japan)

^c OLYMPUS CORPORATION   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

^e HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005330510     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581237     Document Type: Article

References (19)

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