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Volumn 80, Issue , 1996, Pages 353-356

Study of the X-ray microbeam for scanning microscopes

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[No Author keywords available]

Indexed keywords

EID: 0002364324 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/0368-2048(96)02990-8 Document Type: Article

Times cited : (4)

References (15)

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