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Volumn 5, Issue 3, 1998, Pages 1111-1113
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Submicrometre-area high-energy-resolution photoelectron spectroscopy system
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Author keywords
Microbeams; Photoelectron spectroscopy; Schwarzschild objectives; Soft X rays; Undulators
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Indexed keywords
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EID: 0032394926
PISSN: 09090495
EISSN: None
Source Type: Journal
DOI: 10.1107/S090904959701426X Document Type: Article |
Times cited : (5)
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References (8)
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