In situ transmission electron microscope studies of the kinetics of abnormal grain growth in electroplated copper films

Applied Physics Letters

Volumn 76, Issue 3, 2000, Pages 309-311

  Hau Riege, Stefan P ^a   Thompson, Carl V ^a  

^a Department of Civil and Environmental Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005259528     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125729     Document Type: Article

References (11)

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