Surface roughness in sputtered SnO2 films studied by atomic force microscopy and spectroscopic light scattering

Journal of Applied Physics

Volumn 87, Issue 9 I, 2000, Pages 4562-4571

  Lindström, Tomas ^a   Isidorsson, Jan ^a   Niklasson, Gunnar A ^a  

^a UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005007544     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373103     Document Type: Article

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