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Volumn 71, Issue 4, 2000, Pages 1712-1715

Magnetic axial field measurements on a high resolution miniature scanning electron microscope

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0004947410     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150525     Document Type: Article
Times cited : (15)

References (8)
  • 6
    • 0038849932 scopus 로고    scopus 로고
    • Department of Electrical Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260
    • A. Khursheed, KEOS (1998), Department of Electrical Engineering, National University of Singapore, 10 Kent Ridge Crescent, Singapore 119260.
    • (1998) KEOS
    • Khursheed, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.