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1
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0025684564
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Building reliability into EPROMS
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New Orleans, March 1990
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Baglee, D.A., Nannemann, L., Huang, C., "Building reliability into EPROMS", 28th International Reliability Physics Symposium, New Orleans, March 1990, pp. 12-18.
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28th International Reliability Physics Symposium
, pp. 12-18
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Baglee, D.A.1
Nannemann, L.2
Huang, C.3
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2
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0042026369
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Evolution of VLSI reliability engineering
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Bordeaux, October 1991
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Crook, D.L., "Evolution of VLSI reliability engineering", 2nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Bordeaux, October 1991, pp. 293-312.
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2nd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
, pp. 293-312
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Crook, D.L.1
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3
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84887311028
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Building in reliability during product development in IBM microelectronics
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Lake Tahoe, October 1993
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Rathore, H.S., Wachnik, R.A., Filippi, R., Gajda, J., "Building in reliability during product development in IBM microelectronics", International Reliability Workshop, Lake Tahoe, October 1993, p. 137.
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International Reliability Workshop
, pp. 137
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Rathore, H.S.1
Wachnik, R.A.2
Filippi, R.3
Gajda, J.4
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4
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84887279971
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BIR customer and supplier perspectives
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Lake Tahoe, October 1993
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Radojcic, R., Thomas, R.W., "BIR customer and supplier perspectives", International Reliability Workshop, Lake Tahoe, October 1993, p. TB 1.
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International Reliability Workshop
, pp. 1
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Radojcic, R.1
Thomas, R.W.2
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6
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0026136482
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Building in reliability - making it work
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Las Vegas, NV, April 1991
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Schafft, H.A., Baglee, D.A., Kennedy, P.E., "Building in reliability - making it work" in 29th International Reliability Physics Symposium, Las Vegas, NV, April 1991, pp. 1-7.
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29th International Reliability Physics Symposium
, pp. 1-7
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Schafft, H.A.1
Baglee, D.A.2
Kennedy, P.E.3
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7
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0026187901
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Modern reliability assurance of integrated circuits - a strategy based on technology capability assessment and production reproducibility control
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Gerling, W. (1991), "Modern reliability assurance of integrated circuits - a strategy based on technology capability assessment and production reproducibility control" in International Journal of Quality & Reliability Engineering, Vol. 4, No. 7, pp. 207-14.
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(1991)
International Journal of Quality & Reliability Engineering
, vol.4
, Issue.7
, pp. 207-214
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Gerling, W.1
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8
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84887273536
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Building in reliability of metalization using a design of experiments
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Bordeaux, October 1993
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Gounelle, C., Marty, M., Sautreuil, B., Lormand, G., Cueirolo, P., Caprile, C., Mortini, P., "Building in reliability of metalization using a design of experiments", 4th European Symposium on Reliability of Electron Devices Failure Physics and Analysis, Bordeaux, October 1993, p. 97.
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4th European Symposium on Reliability of Electron Devices Failure Physics and Analysis
, pp. 97
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Gounelle, C.1
Marty, M.2
Sautreuil, B.3
Lormand, G.4
Cueirolo, P.5
Caprile, C.6
Mortini, P.7
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9
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0024665755
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In line wafer level reliability monitors
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Davis, M., Hass, F. (1989), "In line wafer level reliability monitors" in Solid State Technology, Vol. 32, No. 5, pp. 107-10.
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(1989)
Solid State Technology
, vol.32
, Issue.5
, pp. 107-110
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Davis, M.1
Hass, F.2
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10
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0026243090
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Correlating observable defects and yield
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October 1991
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Betel, D., Bar-Ilan, O., Burger, A., "Correlating observable defects and yield", Semiconductor International, October 1991.
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Semiconductor International
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Betel, D.1
Bar-Ilan, O.2
Burger, A.3
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11
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84887302061
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Statistical bin limits - containing factory excursions near the source
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18
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Riordan, W.C., Vasquez, R.M. (18), "Statistical bin limits - containing factory excursions near the source".
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Riordan, W.C.1
Vasquez, R.M.2
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12
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0026821292
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Statistical bin limits - an approach to wafer disposition in I.C. fabrication
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Baglee, D.A., Illyes, S. (1992), "Statistical bin limits - an approach to wafer disposition in I.C. fabrication", IEEE Transactions on Semiconductor Manufacturing, Vol. 5, No. 1.
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(1992)
IEEE Transactions on Semiconductor Manufacturing
, vol.5
, Issue.1
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Baglee, D.A.1
Illyes, S.2
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15
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84887278846
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Reliability yield and quality - correlation for a particular failure mechanism
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Prendergast, J., "Reliability yield and quality - correlation for a particular failure mechanism".
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Prendergast, J.1
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