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Volumn 13, Issue 5, 1996, Pages 77-90

Building-in reliability - implementation and benefits

Author keywords

Monitoring; Products; Reliability

Indexed keywords


EID: 0004268778     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656719610118115     Document Type: Article
Times cited : (9)

References (15)
  • 3
    • 84887311028 scopus 로고    scopus 로고
    • Building in reliability during product development in IBM microelectronics
    • Lake Tahoe, October 1993
    • Rathore, H.S., Wachnik, R.A., Filippi, R., Gajda, J., "Building in reliability during product development in IBM microelectronics", International Reliability Workshop, Lake Tahoe, October 1993, p. 137.
    • International Reliability Workshop , pp. 137
    • Rathore, H.S.1    Wachnik, R.A.2    Filippi, R.3    Gajda, J.4
  • 7
    • 0026187901 scopus 로고
    • Modern reliability assurance of integrated circuits - a strategy based on technology capability assessment and production reproducibility control
    • Gerling, W. (1991), "Modern reliability assurance of integrated circuits - a strategy based on technology capability assessment and production reproducibility control" in International Journal of Quality & Reliability Engineering, Vol. 4, No. 7, pp. 207-14.
    • (1991) International Journal of Quality & Reliability Engineering , vol.4 , Issue.7 , pp. 207-214
    • Gerling, W.1
  • 9
    • 0024665755 scopus 로고
    • In line wafer level reliability monitors
    • Davis, M., Hass, F. (1989), "In line wafer level reliability monitors" in Solid State Technology, Vol. 32, No. 5, pp. 107-10.
    • (1989) Solid State Technology , vol.32 , Issue.5 , pp. 107-110
    • Davis, M.1    Hass, F.2
  • 11
    • 84887302061 scopus 로고    scopus 로고
    • Statistical bin limits - containing factory excursions near the source
    • 18
    • Riordan, W.C., Vasquez, R.M. (18), "Statistical bin limits - containing factory excursions near the source".
    • Riordan, W.C.1    Vasquez, R.M.2
  • 12
    • 0026821292 scopus 로고
    • Statistical bin limits - an approach to wafer disposition in I.C. fabrication
    • Baglee, D.A., Illyes, S. (1992), "Statistical bin limits - an approach to wafer disposition in I.C. fabrication", IEEE Transactions on Semiconductor Manufacturing, Vol. 5, No. 1.
    • (1992) IEEE Transactions on Semiconductor Manufacturing , vol.5 , Issue.1
    • Baglee, D.A.1    Illyes, S.2
  • 15
    • 84887278846 scopus 로고    scopus 로고
    • Reliability yield and quality - correlation for a particular failure mechanism
    • Prendergast, J., "Reliability yield and quality - correlation for a particular failure mechanism".
    • Prendergast, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.