Building reliability into EPROMs

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1990, Pages 12-18

  Baglee, David A ^a   Nannemann, Lynn ^a   Huang, Cheng ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE; PRODUCTION ENGINEERING--RELIABILITY;

EPROM; MANUFACTURING CONTROL; PROCESS INTERACTIONS; PROCESS MONITORING;

DATA STORAGE, DIGITAL;

EID: 0025684564     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)