Correlating observable defects and yield

Semiconductor International

Volumn 14, Issue 11, 1991, Pages 128-130

  Betal, David ^a   Bar Ilan, Cren ^a   Burger, Alberto ^a  

^a National Semiconductor   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE, DIGITAL--PROM; INTEGRATED CIRCUITS, CMOS--DEFECTS;

EPROM; WAFERS;

INTEGRATED CIRCUIT TESTING;

EID: 0026243090     PISSN: 01633767     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)