Component failures based on flaw distributions

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 1989, Pages 91-95

  Jensen, Finn ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUITS--FAILURE; PROBABILITY;

COMPONENT FAILURES; FAILURE RATE MODEL; FLAW DISTRIBUTIONS; IC FAILURE MECHANISMS; LIFE DISTRIBUTION;

FAILURE ANALYSIS;

EID: 0024480909     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)