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Volumn 89, Issue 2, 2001, Pages 911-914
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Spatial profiles of neutral, ion, and etch uniformity in a large-area high-density plasma reactor
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0003234125
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1335620 Document Type: Article |
Times cited : (12)
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References (17)
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