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Volumn 294, Issue 1-2, 1997, Pages 93-97

Ternary SiGeC alloys: Growth and properties of a new semiconducting material

Author keywords

Alloys; Growth mechanism; Semiconductors; SiGeC

Indexed keywords

CHEMICAL VAPOR DEPOSITION; MOLECULAR BEAM EPITAXY; SEMICONDUCTING FILMS; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTOR GROWTH; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0003127071     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)09250-4     Document Type: Article
Times cited : (27)

References (28)
  • 3
    • 0001548018 scopus 로고
    • Carbon in Monocrystalline Silicon
    • T.S. Moss (ed.), Elsevier, Amsterdam
    • G. Davies and R.C. Newman, Carbon in Monocrystalline Silicon, in T.S. Moss (ed.), Handbook of Semiconductors, Vol. 3, Elsevier, Amsterdam, 1994.
    • (1994) Handbook of Semiconductors , vol.3
    • Davies, G.1    Newman, R.C.2
  • 11
    • 0003459529 scopus 로고
    • Perkin-Elmer Corporation Physical Electronics Division, Eden Prairie, MN
    • J. Chastain, Handbook of X-ray Photoelectron Spectroscopy, Perkin-Elmer Corporation Physical Electronics Division, Eden Prairie, MN, 1992.
    • (1992) Handbook of X-ray Photoelectron Spectroscopy
    • Chastain, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.