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Volumn 57, Issue 1, 2000, Pages 51-59

Investigations on the effect of alpha particle irradiation-induced defects near Pd/n-GaAs interface

Author keywords

Annealing; C V measurement; Control; I V measurement; Irradiation; Schottky barrier diode

Indexed keywords


EID: 0002805749     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0042-207x(99)00211-0     Document Type: Article
Times cited : (26)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.