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Volumn 57, Issue 1, 2000, Pages 51-59
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Investigations on the effect of alpha particle irradiation-induced defects near Pd/n-GaAs interface
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Author keywords
Annealing; C V measurement; Control; I V measurement; Irradiation; Schottky barrier diode
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Indexed keywords
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EID: 0002805749
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/s0042-207x(99)00211-0 Document Type: Article |
Times cited : (26)
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References (12)
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