Investigations on the evaluation of schottky barrier diode parameters of the proton irradiated Ti/n-GaAs

Radiation Effects and Defects in Solids

Volumn 152, Issue 1, 2000, Pages 39-47

  Jayavel, P ^a   Arulkumaran, S ^a   Kumar, J ^a   Premanand, R ^b  

^a ANNA UNIVERSITY   (India)

^b SRM INSTITUTE OF SCIENCE AND TECHNOLOGY   (India)

Author keywords

Annealing; CONTROL; Irradiation; Schottky barrier diode

Indexed keywords

EID: 0347614843     PISSN: 10420150     EISSN: None     Source Type: Journal    
DOI: 10.1080/10420150008211812     Document Type: Article

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