Analyses of small facets imaged with scanning-probe microscopy

Journal of Applied Physics

Volumn 86, Issue 7, 1999, Pages 3661-3669

  Hegeman, J B J W ^a   Kooi, B J ^a   Groen, H B ^a   De Hosson, J Th M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0002662693     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371275     Document Type: Article

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