Quantitative analysis of a fracture surface by atomic force microscopy

Physical Review E - Statistical Physics, Plasmas, Fluids, and Related Interdisciplinary Topics

Volumn 53, Issue 6, 1996, Pages 5637-5642

  Daguier, Pascal ^a,b   Henaux, Stéphane ^a,b   Bouchaud, Elisabeth ^a,b   Creuzet, François ^a,b  

^a ONERA   (France)

^b CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001356084     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.53.5637     Document Type: Article

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