Characterization of a graded index of refraction separate confinement heterostructure (GRINSCH) laser structure using contactless electroreflectance

Journal of Applied Physics

Volumn 84, Issue 4, 1998, Pages 2229-2235

  Krystek, Wojciech ^a   Leibovitch, M ^a,d   Sun, W D ^a   Pollak, Fred H ^a   Gumbs, Godfrey ^b   Burnham, G T ^c   Wang, X ^c  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b CITY UNIVERSITY OF NEW YORK   (United States)

^c Semiconduct Laser Intl Corporation   (United States)

^d NONE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005209549     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368288     Document Type: Article

References (32)

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