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Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

Low temperature forcemicroscopy based on piezoresistive cantilevers operating at a higher flexural mode

(2) Volodin, A a Van Haesendonck, C a

a UNIVERSITY OF LEUVEN (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION METHODS; FLEXURAL MODES; FORCE MICROSCOPY; HEAT DISSIPATION; IMAGING CAPABILITIES; LOW TEMPERATURES; MECHANICAL RESONANCE; NON-CONTACT; PIEZO-RESISTIVE CANTILEVERS; SUPERCONDUCTOR SURFACES;

FREQUENCY MODULATION; SUPERCONDUCTING MATERIALS;

NANOCANTILEVERS;

EID: 0002488883 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051151 Document Type: Article

Times cited : (20)

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