Process outlook for analog and RF applications

Microelectronic Engineering

Volumn 54, Issue 1-2, 2000, Pages 35-48

  Bruines, Joop J P ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CROSSTALK; MATHEMATICAL MODELS; SILICON; STATIC RANDOM ACCESS STORAGE;

NON-QUASISTATIC (NQS) EFFECTS; SILICON-ON-ANYTHING (SOA); SYTEM-ON CHIP (SOC);

CMOS INTEGRATED CIRCUITS;

EID: 0002450166     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(00)80057-X     Document Type: Article

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