Testing TAPed cores and wrapped cores with the same test access mechanism

Proceedings -Design, Automation and Test in Europe, DATE

Volumn , Issue , 2001, Pages 150-155

  Benabdenbi, Mounir ^a   Maroufi, Walid ^a,b   Marzouki, Meryem ^a  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^b NORTEL NETWORKS   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY SCAN TEST; RECONFIGURABLE; SYSTEM ON A CHIP; TEST ACCESS MECHANISM;

PROGRAMMABLE LOGIC CONTROLLERS; RECONFIGURABLE ARCHITECTURES;

EXHIBITIONS;

EID: 0001940334     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2001.915016     Document Type: Conference Paper

References (11)

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