Electric field dependence of the electron capture cross section of neutral traps in SiO2

Journal of the Electrochemical Society

Volumn 143, Issue 8, 1996, Pages 2687-2690

  Palma, A ^a   Lopez Villanueva J A ^a   Carceller, J E ^a  

^a UNIVERSITY OF GRANADA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; ELECTRIC FIELD EFFECTS; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; MATRIX ALGEBRA; MICROSCOPIC EXAMINATION; MONTE CARLO METHODS; NUMERICAL ANALYSIS; PHONONS; PROBABILITY; SILICA;

DEEP NEUTRAL CENTERS; ELECTRON CAPTURE CROSS SECTION; MULTIPHONON CAPTURE PROBABILITY;

ELECTRONS;

EID: 0030212415     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1837072     Document Type: Article

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