Electron irradiation-induced changes in the surface topography of silicon dioxide

Journal of Applied Physics

Volumn 80, Issue 8, 1996, Pages 4308-4314

  Stevens Kalceff, M A ^a   Phillips, M R ^a   Moon, A R ^a  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040372741     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363379     Document Type: Article

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