Optical characterization of hydrogenated silicon thin films using interference technique

Journal of Applied Physics

Volumn 88, Issue 4, 2000, Pages 1907-1915

  Globus, Tatiana ^a   Ganguly, Gautam ^b   Roca I Cabarrocas, Pere ^c  

^a University of Virginia   (United States)

^b Ecole Polytechnique ^*  (United States)

^c LABORATOIRE DE PHYSIQUE DES INTERFACES ET DES COUCHES MINCES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001673743     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1305855     Document Type: Article

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