Modeling of light-emission spectra measured on silicon nanometer-scale diode antifuses

Journal of Applied Physics

Volumn 88, Issue 4, 2000, Pages 1916-1922

  Akil, N ^a   Houtsma, V E ^a   LeMinh, P ^a   Holleman, J ^a   Zieren, V ^b   De Mooij, D ^b   Woerlee, P H ^a,b   Van Den Berg, A ^a   Wallinga, H ^a  

^a UNIVERSITY OF TWENTE   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001653098     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1305552     Document Type: Article

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