Waveguide effect on the image formation process in near-field photocurrent spectroscopy of semiconductor laser diodes

Surface and Interface Analysis

Volumn 25, Issue 7-8, 1997, Pages 573-582

  Richter, A ^a   Lienau, Ch ^a   Tomm, J W ^a  

^a MAX BORN INSTITUT   (Germany)

Author keywords

Laser diodes; Near field microscopy; Optics; Photocurrent spectroscopy; Semi conductor lasers

Indexed keywords

AGING OF MATERIALS; CRYSTAL DEFECTS; HIGH POWER LASERS; IMAGING TECHNIQUES; LASER BEAMS; MATHEMATICAL MODELS; OPTOELECTRONIC DEVICES; SPECTROSCOPIC ANALYSIS; WAVEGUIDES;

NEAR FIELD PHOTOCURRENT SPECTROSCOPY; SURFACE RECOMBINATION;

SEMICONDUCTOR LASERS;

EID: 0031152848     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199706)25:7/8<573::aid-sia275>3.0.co;2-y     Document Type: Article

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