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Volumn 16, Issue 3, 1998, Pages 1311-1315

Growth of SiC and SiCxNy films by pulsed laser ablation of SiC in Ar and N2 environments

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001597593     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581143     Document Type: Article
Times cited : (56)

References (26)
  • 9
    • 0003597031 scopus 로고
    • edited by G. L. Harris INSPEC, The Institution of Electrical Engineers, London
    • S. Yoshida, in Properties of Silicon Carbide, edited by G. L. Harris (INSPEC, The Institution of Electrical Engineers, London, 1995), p. 74.
    • (1995) Properties of Silicon Carbide , pp. 74
    • Yoshida, S.1
  • 10
    • 11644313178 scopus 로고    scopus 로고
    • R. Allan, New Sci. 154, 34 (1997).
    • (1997) New Sci. , vol.154 , pp. 34
    • Allan, R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.