X-ray diffraction investigation of n-type porous silicon

Journal of Applied Physics

Volumn 89, Issue 1, 2001, Pages 174-180

  Chamard, V ^a   Dolino, G ^a  

^a UNIV GRENOBLE ALPES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001575243     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1326857     Document Type: Article

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