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Volumn 144, Issue 4, 1997, Pages 1463-1468

Deformation of porous silicon lattice caused by absorption/desorption processes

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ANNEALING; ANODIC OXIDATION; DESORPTION; LATTICE CONSTANTS; POROUS SILICON; SILICON WAFERS;

EID: 0031124234     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1837612     Document Type: Article
Times cited : (21)

References (18)
  • 6
    • 0003523588 scopus 로고
    • NATO ASI Ser. D., Bensahel, L. Canham, S. Ossicini, Editors, Kluwer Acad. Publ., Dordrecht
    • V. Lehman, in Optical Properties of Low Dimensional Silicon Structures, NATO ASI Ser. D., Bensahel, L. Canham, S. Ossicini, Editors, Kluwer Acad. Publ., Dordrecht (1993).
    • (1993) Optical Properties of Low Dimensional Silicon Structures
    • Lehman, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.