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Volumn 87, Issue 3, 2000, Pages 1165-1171

Light scattering and atomic force microscopy study of InAs island formation on InP

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001563127     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371994     Document Type: Article
Times cited : (16)

References (39)
  • 34
    • 0025593577 scopus 로고
    • Ultrafast laser probe phenomenon in bulk and microstructure semiconductors
    • edited by R. R. Alfano, SPIE, Bellingham
    • D. S. Kim and P. Y. Yu, in Ultrafast Laser Probe Phenomenon in Bulk and Microstructure Semiconductors, edited by R. R. Alfano, SPIE Symposium Proceedings, No. 1282 (SPIE, Bellingham, 1990), p. 39.
    • (1990) SPIE Symposium Proceedings , vol.1282 , pp. 39
    • Kim, D.S.1    Yu, P.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.