Correlation between Si-H/D bond desorption and injected electron energy in metal-oxide-silicon tunneling diodes

Applied Physics Letters

Volumn 78, Issue 5, 2001, Pages 637-639

  Lin, C H ^a   Lee, M H ^a   Liu, C W ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001546595     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1343477     Document Type: Article

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