Experimental evidence for recombination-assisted leakage in thin oxides

Applied Physics Letters

Volumn 76, Issue 13, 2000, Pages 1719-1721

  Ielmini, Daniele ^b   Spinelli, Alessandro S ^a,b   Lacaita, Andrea L ^b  

^a UNIVERSITY OF INSUBRIA   (Italy)

^b POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001527187     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126146     Document Type: Article

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