Separation of electron and hole traps by transient current analysis

Microelectronic Engineering

Volumn 48, Issue 1, 1999, Pages 151-154

  Spinelli, A S ^a   Lacaita, A L ^b   Rigamonti, M ^b   Ielmini, D ^b   Ghidini, G ^c  

^a Dipartimento di Scienze Chimiche   (Italy)

^b POLITECNICO DI MILANO   (Italy)

^c STMICROELECTRONICS   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRIC POTENTIAL; ELECTRON TRAPS; ENERGY GAP; HOLE TRAPS; TRANSIENTS;

TRANSIENT CURRENT ANALYSIS;

MOS DEVICES;

EID: 0033190157     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-9317(99)00359-7     Document Type: Article

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