메뉴 건너뛰기




Volumn 76, Issue 13, 2000, Pages 1767-1769

Al composition dependence of breakdown voltage in AlxGa1-xN Schottky rectifiers

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001518843     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126161     Document Type: Article
Times cited : (56)

References (16)
  • 15
    • 0003809788 scopus 로고    scopus 로고
    • Properties, processing and applications of GaN and related semiconductors
    • edited by J. H. Edgar, S. Strite, I. Akasaki, H. Amano, and C. Wetzel IEE, London
    • H. Amano and I. Akasaki, in Properties, Processing and Applications of GaN and Related Semiconductors, EMIS Data Review No. 23, edited by J. H. Edgar, S. Strite, I. Akasaki, H. Amano, and C. Wetzel (IEE, London, 1999).
    • (1999) EMIS Data Review No. 23 , vol.23
    • Amano, H.1    Akasaki, I.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.