The refractive indices of Zn1-xCdxS alloys

Semiconductor Science and Technology

Volumn 13, Issue 12, 1998, Pages 1439-1441

  Chen, P ^a   Nicholls, J E ^a   O'Neill, M ^a   Hogg, J H C ^a   Lunn, B ^a   Ashenford, D E ^a   Fay, M ^b   Cullis, A G ^b  

^a UNIVERSITY OF HULL   (United Kingdom)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC DISPERSION; ELLIPSOMETRY; LIGHT MEASUREMENT; LIGHT REFLECTION; MOLECULAR BEAM EPITAXY; REFRACTIVE INDEX; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SINGLE CRYSTALS; SUBSTRATES; TERNARY SYSTEMS; WAVEGUIDES;

GALLIUM PHOSPHIDE;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 0032305285     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/13/12/019     Document Type: Article

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