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Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

Eddy currentmicroscopy

(3) Hoffmann, B a Houbertz, R a Hartmann, U a

a SAARLAND UNIVERSITY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CLOSE PROXIMITY; CONDUCTING MATERIALS; CONDUCTING PROBES; CONDUCTING SURFACES; EDDY CURRENT IMAGING; ELECTRODYNAMIC INTERACTION; EXPERIMENTAL DATA; FERROMAGNETIC DOMAINS; HIGHLY SENSITIVE; INDUCED EDDY CURRENTS; LOCAL VARIATIONS; MAGNETIC SAMPLES; MATERIAL COMPOSITIONS; NONDESTRUCTIVE IMAGING; NONMAGNETICS; STRAY FIELD; SUBSURFACE FEATURES;

FERROMAGNETIC MATERIALS; FERROMAGNETISM; HELMHOLTZ EQUATION; MAGNETIC DOMAINS; MAGNETIC FORCE MICROSCOPY; PROBES;

EDDY CURRENTS;

EID: 26744470552 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051173 Document Type: Article

Times cited : (35)

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