메뉴 건너뛰기




Volumn 4, Issue 2, 1997, Pages 245-269

Direct measurements of surface stress using transmission electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 3343023910     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X97000249     Document Type: Article
Times cited : (2)

References (82)
  • 10
    • 0028436888 scopus 로고
    • and references therein
    • See for example: R. C. Cammarata, Prog. Surf. Sci. 46, 1 (1994) and references therein.
    • (1994) Prog. Surf. Sci. , vol.46 , pp. 1
    • Cammarata, R.C.1
  • 11
    • 0002358415 scopus 로고
    • eds. R. Gomer and C. S. Smith (University of Chicago, Chicago)
    • C. Herring, Structure and Properties of Solid Surfaces, eds. R. Gomer and C. S. Smith (University of Chicago, Chicago, 1953), p.5.
    • (1953) Structure and Properties of Solid Surfaces , pp. 5
    • Herring, C.1
  • 25
    • 85033181468 scopus 로고
    • PhD thesis (University of Illinois)
    • R. D. Twesten, PhD thesis (University of Illinois, 1995).
    • (1995)
    • Twesten, R.D.1
  • 53
    • 0025687720 scopus 로고
    • G. Martinelli and M. Sacerdoi, Ultramicroscopy 34, 289 (1990). These measurements, however, were performed at 100 kV and with about four times larger objective aperture.
    • (1990) Ultramicroscopy , vol.34 , pp. 289
    • Martinelli, G.1    Sacerdoi, M.2
  • 64
    • 0004246662 scopus 로고
    • Inspec, New York
    • Insitution of Electrical Engineers, Properties of Silicon (Inspec, New York, 1988).
    • (1988) Properties of Silicon


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.