Direct measurements of surface stress using transmission electron microscopy

Surface Review and Letters

Volumn 4, Issue 2, 1997, Pages 245-269

  Twesten, R D ^a,c   Gibson, J M ^a   Hellman, O C ^b,d  

^a United States of America   (United States)

^b NTT Basic Research Laboratories   (Japan)

^c SANDIA NATIONAL LABORATORIES   (United States)

^d Tanaka Solid Junction Project ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3343023910     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X97000249     Document Type: Article

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