1/f-noise study of undoped intrinsic hydrogenated amorphous silicon thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 3, 1999, Pages 1477-1479

  Güneş, Mehmet ^a,b   Johanson, Robert E ^a   Kasap, S O ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

^b IZMIR INSTITUTE OF TECHNOLOGY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001300953     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.1477     Document Type: Article

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