Effect of light exposure on 1/f noise in a-Si:H

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 17, Issue 1, 1999, Pages 73-76

  Scansen, D ^a   Kasap, S O ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 24644455362     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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