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Volumn 40, Issue 2-3, 1996, Pages 101-118

High ion density dry etching of compound semiconductors

Author keywords

Compound semiconductors; Dry etching; Electron cyclotron resonance

Indexed keywords

ASPECT RATIO; DRY ETCHING; ELECTRODES; ELECTRON CYCLOTRON RESONANCE; PLASMA SOURCES; REACTION KINETICS; REACTIVE ION ETCHING; SEMICONDUCTING GALLIUM ARSENIDE; SPUTTERING; SUBSTRATES;

EID: 0001294856     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-5107(96)01659-5     Document Type: Review
Times cited : (36)

References (99)
  • 4
    • 0022819755 scopus 로고
    • P.C. Zalm, Vacuum, 36 (1986) 787.
    • (1986) Vacuum , vol.36 , pp. 787
    • Zalm, P.C.1
  • 5
    • 0004255148 scopus 로고
    • D. Manos and D.L. Flaman (eds.), Academic, New York
    • D.L. Flamm, in D. Manos and D.L. Flaman (eds.), Plasma Etching - An Introduction, Academic, New York, 1989.
    • (1989) Plasma Etching - An Introduction
    • Flamm, D.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.