Role of defects in producing negative temperature dependence of breakdown voltage in SiC

Applied Physics Letters

Volumn 72, Issue 24, 1998, Pages 3196-3198

  Raghunathan, R ^a   Baliga, B J ^a  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001292337     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121591     Document Type: Article

References (11)

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