Effect of surface inhomogeneities on the electrical characteristics of SiC schottky contacts

IEEE Transactions on Electron Devices

Volumn 43, Issue 1, 1996, Pages 150-156

  Bhatnagar, Mohit ^a   Jayant Baliga, B ^b   Kirk, H R ^c   Rozgonyi, G A ^a  

^a MOTOROLA INC   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c North Carolina State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; LEAKAGE CURRENTS; MATHEMATICAL MODELS; PLATINUM; SCHOTTKY BARRIER DIODES; SILICON CARBIDE; TITANIUM; VOLTAGE MEASUREMENT;

CAPACITANCE VOLTAGE MEASUREMENT; SCHOTTKY RECTIFIERS; THERMIONIC EMISSION THEORY; TWO DIMENSIONAL NUMERICAL SIMULATION;

ELECTRIC RECTIFIERS;

EID: 0029770349     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.477606     Document Type: Article

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