X-ray Moiré Topography on SIMOX Structures

Journal of Applied Crystallography

Volumn 29 PART 5, Issue , 1996, Pages 568-573

  Ohler, Michael ^a,b   Prieur, Eetu ^b   Härtwig, Jürgen ^b  

^a Max Planck Arbeitsgruppe H   (Germany)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2542627598     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889896006401     Document Type: Article

References (13)

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