-
4
-
-
28444459024
-
-
F. K. LeGoues, B. S. Meyerson, J. F. Morar, and P. D. Kirchner, J. Appl. Phys. 71, 4230 (1992).
-
(1992)
J. Appl. Phys.
, vol.71
, pp. 4230
-
-
LeGoues, F.K.1
Meyerson, B.S.2
Morar, J.F.3
Kirchner, P.D.4
-
5
-
-
36449006709
-
-
J. W. Hsu, E. A. Fitzgerald, Y. H. Xie, P. J. Siverman, and M. J. Cardillo, Appl. Phys. Lett. 61, 1293 (1992); M. A. Lutz, R. M. Feenstra, F. K. LeGoues, P. M. Mooney, and J. O. Chu, ibid. 66, 724 (1995).
-
(1992)
Appl. Phys. Lett.
, vol.61
, pp. 1293
-
-
Hsu, J.W.1
Fitzgerald, E.A.2
Xie, Y.H.3
Siverman, P.J.4
Cardillo, M.J.5
-
6
-
-
36449001750
-
-
J. W. Hsu, E. A. Fitzgerald, Y. H. Xie, P. J. Siverman, and M. J. Cardillo, Appl. Phys. Lett. 61, 1293 (1992); M. A. Lutz, R. M. Feenstra, F. K. LeGoues, P. M. Mooney, and J. O. Chu, ibid. 66, 724 (1995).
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 724
-
-
Lutz, M.A.1
Feenstra, R.M.2
LeGoues, F.K.3
Mooney, P.M.4
Chu, J.O.5
-
7
-
-
85034562730
-
-
note
-
The Si(001) substrates (supposedly nominal) that we have used are misorientated towards the (110) directions by at most 0.26° (x-ray diffraction).
-
-
-
-
9
-
-
0030564491
-
-
C. Bocchi, A. Bosacchi, C. Ferrari, S. Franchi, P. Franzosi, R. Magnanini, and L. Nasi, J. Cryst. Growth 165, 8 (1996).
-
(1996)
J. Cryst. Growth
, vol.165
, pp. 8
-
-
Bocchi, C.1
Bosacchi, A.2
Ferrari, C.3
Franchi, S.4
Franzosi, P.5
Magnanini, R.6
Nasi, L.7
-
10
-
-
0027701387
-
-
P. F. Fewster, Semicond. Sci. Technol. 8, 1915 (1993); D. K. Bowen and B. K. Tanner, High Resolution X-ray Diffractometry and Topography (Taylor & Francis, London, 1998).
-
(1993)
Semicond. Sci. Technol.
, vol.8
, pp. 1915
-
-
Fewster, P.F.1
-
12
-
-
0001636104
-
-
P. J. Wang, M. S. Goorsky, B. S. Meyerson, F. K. LeGoues, and M. J. Tejwani, Appl. Phys. Lett. 59, 814 (1991).
-
(1991)
Appl. Phys. Lett.
, vol.59
, pp. 814
-
-
Wang, P.J.1
Goorsky, M.S.2
Meyerson, B.S.3
Legoues, F.K.4
Tejwani, M.J.5
-
15
-
-
0001674765
-
-
J. H. Li, G. Springholtz, J. Stangl, H. Seyringer, V. Holy, F. Schäffler, and G. Bauer, J. Vac. Sci. Technol. B 16, 1610 (1998).
-
(1998)
J. Vac. Sci. Technol. B
, vol.16
, pp. 1610
-
-
Li, J.H.1
Springholtz, G.2
Stangl, J.3
Seyringer, H.4
Holy, V.5
Schäffler, F.6
Bauer, G.7
-
16
-
-
0000069616
-
-
J. Huang, Z. Ye, H. Lu, and D. Que, J. Appl. Phys. 83, 171 (1998).
-
(1998)
J. Appl. Phys.
, vol.83
, pp. 171
-
-
Huang, J.1
Ye, Z.2
Lu, H.3
Que, D.4
-
17
-
-
0000756466
-
-
S. Takagi, J. Phys. Soc. Jpn. 26, 1239 (1969); D. Taupin, Bull. Soc. Fr. Mineral. Cristallogr. 87, 469 (1964).
-
(1969)
J. Phys. Soc. Jpn.
, vol.26
, pp. 1239
-
-
Takagi, S.1
-
19
-
-
3643143147
-
-
Y.-W. Mo, D. E. Savage, B. S. Swartzentruber, and M. G. Lagally, Phys. Rev. Lett. 65, 1020 (1990).
-
(1990)
Phys. Rev. Lett.
, vol.65
, pp. 1020
-
-
Mo, Y.-W.1
Savage, D.E.2
Swartzentruber, B.S.3
Lagally, M.G.4
-
22
-
-
0000382406
-
-
R. Hammond, P. J. Phillips, T. E. Whall, E. H. C. Parker, T. Graf, H. Von Känel, and A. J. Shields, Appl. Phys. Lett. 71, 2517 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 2517
-
-
Hammond, R.1
Phillips, P.J.2
Whall, T.E.3
Parker, E.H.C.4
Graf, T.5
Von Känel, H.6
Shields, A.J.7
-
23
-
-
0000406560
-
-
P. Waltereit, J. M. Fernández, S. Kaya, and T. J. Thornton, Appl. Phys. Lett. 72, 2262 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 2262
-
-
Waltereit, P.1
Fernández, J.M.2
Kaya, S.3
Thornton, T.J.4
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