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2
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0029333792
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Bellingham
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H. Zogg, A. Fach, J. John, J. Masek, P. Müller, C. Paglino, and S. Blunier, Opt. Eng. (Bellingham) 34, 1964 (1995).
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Opt. Eng.
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3
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0016569938
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L. H. DeVaux, H. Kimura, M. J. Sheets, F. J. Renda, J. R. Balon, P. A. Chia, and A. H. Lockwood, Infrared Phys. 15, 271 (1975).
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H. Holloway, in Physics of Thin Films (Academic, New York, 1980), Vol. 11, p. 105.
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Physics of Thin Films
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8
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P. R. Norton, Opt. Eng. (Bellingham) 30, 1649 (1991).
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Norton, P.R.1
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9
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0000414672
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The buffer layer may be omitted completely, at least for PbSe and PbSnSe layers; see P. Müller, A. Fach, J. John, A. N. Tiwari, H. Zogg, and G. Kostorz, J. Appl. Phys. 79, 1911 (1996).
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Kostorz, G.6
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10
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0000442523
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H. Zogg, S. Blunier, A. Fach, C. Maissen, P. Müller, S. Teodoropol, V. Meyer, G. Kostorz, A. Dommann, and T. Richmond, Phys. Rev. B 50, 10801 (1994).
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Zogg, H.1
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11
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85034541850
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Diss. ETH 12557
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J. John, Diss. ETH 12557, 1998.
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John, J.1
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0032303883
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edited by V. Kumar and S. K. Agarval Narose, New Delhi
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H. Zogg, in Physics of Semiconductor Devices, edited by V. Kumar and S. K. Agarval (Narose, New Delhi, 1998), Vol. II, pp. 768-773.
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Zogg, H.1
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14
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85034533589
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note
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At much lower temperatures, the theoretical band-band recombination cannot be attained by any sensor, the transition temperature to defect limited behavior depends on the band gap and the fabrication technique.
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15
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85034540735
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unpublished
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H. Zogg (unpublished).
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Zogg, H.1
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16
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0026932240
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M. P. Belyansky, A. M. Gaskov, and A. V. Strelkov, Mater. Sci. Eng., B 15, 78 (1992).
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Belyansky, M.P.1
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17
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0000820010
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C. Boschetti, P. H. O. Rappl, A. Y. Ueta, and I. N. Bandeira, Infrared Phys. 34, 281 (1993).
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Boschetti, C.1
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Ueta, A.Y.3
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19
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0031192935
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A. Fach, J. John, P. Müller, C. Paglino, and H. Zogg, J. Electron. Mater. 26, 873 (1997).
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Fach, A.1
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21
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0000921402
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P. Müller, H. Zogg, A. Fach, J. John, C. Paglino, A. N. Tiwari, M. Krejci, and G. Kostorz, Phys. Rev. Lett. 78, 3007 (1997).
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Müller, P.1
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John, J.4
Paglino, C.5
Tiwari, A.N.6
Krejci, M.7
Kostorz, G.8
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