Self-sharpening tip integrated on micro cantilevers with self-exciting piezoelectric sensor for parallel atomic force microscopy

Applied Physics Letters

Volumn 70, Issue 17, 1997, Pages 2318-2320

  Indermuhle P F ^a   Schurmann G ^a   Racine, G A ^a   De Rooij, N F ^a  

^a UNIVERSITY OF NEUCHÂTEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001103223     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118817     Document Type: Article

References (10)

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